| rdf:type | <https://jpsearch.go.jp/term/type/図書> |
| rdfs:label | "Handbook of optical metrology : principles and applications" |
| schema:name | "Handbook of optical metrology : principles and applications" |
| ns0:accessInfo | #accessinfo |
| ns0:agential 2 | _:vb4106700 (an orphan bnode) |
| ns0:agential | _:vb4106701 (an orphan bnode) |
| ns0:sourceInfo | #sourceinfo |
| ns0:spatial | _:vb4106702 (an orphan bnode) |
| ns0:temporal | _:vb4106703 (an orphan bnode) |
| schema:about | <http://id.ndl.go.jp/class/ndlc/M191> (➜ "科学技術一般--測定・測定器一般") |
| schema:contributor | <https://jpsearch.go.jp/entity/ncname/Toru_Yoshizawa_(ed.)> (➜ "Toru Yoshizawa (ed.)") |
| schema:datePublished | "2015" |
| schema:description 4 | "数量・大きさ等: xiii, 905 pages ; 27 cm" |
| schema:description | "著者: edited by Toru Yoshizawa" |
| schema:description | "書誌ID: 026015773" |
| schema:description | "版表示: Second edition" |
| schema:identifier | "ISBN:9781466573598" |
| schema:inLanguage | <http://id.loc.gov/vocabulary/iso639-2/eng> (➜ "英語") |
| schema:isbn | "9781466573598" |
| schema:publisher | <https://jpsearch.go.jp/entity/chname/CRCプレス> |
| schema:spatial | <https://jpsearch.go.jp/entity/place/アメリカ> |
| schema:temporal | <https://jpsearch.go.jp/entity/time/2015> (➜ "2015年") |